Applications / Advanced Logic

Advanced Logic

Enabling the atomic-scale etch precision that makes today's most advanced AI processors manufacturable

  1. FinFET
  2. GAA
  3. CFET
3D rendering of a FinFET transistor gate structure on a circuit-board backdrop
Advanced-node logic deviceSUB-3NM
// The GAA shift

GAA changed everything.

The etch process has to keep up.

3D rendering of a Gate-All-Around (GAAFET) transistor structure on a circuit-board backdrop
Gate-all-around architectureGAAFET

The processors that run AI are built at sub-3nm. The etch process that makes them possible demands atomic-scale precision.

As the industry moves from FinFET to Gate-All-Around (GAA) and then to CFET, process complexity at the etch level increases significantly. Conventional RIE cannot meet the precision these architectures demand — and the gap continues to widen as nodes shrink.

// ALE intensity

ALE intensity grows with every logic generation.

ALE Steps per generationALE intensity →
  1. 4–6
    FinFET
  2. 10–12
    GAA Nanosheet
  3. 12–15
    GAA Forksheet
  4. 20–25
    CFET

As logic architectures advance, the number of steps requiring atomic-scale etch control multiplies. By GAA, ALE is embedded throughout the process flow.

Where AAT's platform is the enabling process:

  • SiGe channel release (GAA and beyond) — no viable alternative to isotropic ALE
  • Inner spacer recess and nanosheet width trim
  • Fork isolation recess in Forksheet architectures
  • Backside power delivery network etch (BSPDN) in CFET
// Where AAT fits

Where AAT Fits

Building GAA structures requires removing sacrificial silicon-germanium (SiGe) layers from between stacked silicon nanosheets with extremely high selectivity to silicon. The process window is too narrow, the surfaces too sensitive, and the tolerance for damage essentially zero. Isotropic ALE provides the selectivity and damage-free surface quality that makes nanosheet release reliably manufacturable at scale.

Beyond nanosheet release, inner spacer formation, self-aligned contact trimming, and backside power delivery structures all introduce new etch steps where atomic-scale control is the requirement, not a preference.

The precision gap↑ Precision required
FinFETGAASub-3nm

The gap widens as nodes shrink

  • AAT ALEMeets the precision requirement
  • Conventional RIECannot keep up

AAT's platform handles these precision finishing steps — not replacing high-throughput RIE for bulk removal, but deployed at the steps where surface quality and dimensional accuracy are non-negotiable. Because the AI optimizer runs in real time, process engineers spend less time on recipe development and more time on device results. At a node where process windows are measured in angstroms, that speed of iteration is not a convenience — it's a competitive advantage.

// Demonstrated performance

Demonstrated Performance

High Precision Mode
~0 Å/ cycle
Etch per cycle (EPC)
  • Synergy Factor>80%
  • Linearity (R²)>0.9947
  • Cycle Time~2 seconds
Self-limiting saturationÅ / time →
Self-limiting · ~1 s
  • Modification saturation~2.0 Å at 1 second
  • Removal saturation~2.1 Å at 1 second

Source: SPIE Advanced Lithography + Patterning 2026, Paper 13984-24

// The AAT advantage

The AAT Advantage

01

Purpose-built for precision, not retrofitted.

AAT's decoupled chamber architecture independently controls the modification and removal steps — giving process engineers step-level tunability that other tools cannot match.

02

AI-native process control.

Machine learning models optimize gas flow, power, and timing continuously — not as a correction mechanism, but as an active part of how the tool runs. For development using manual recipe tuning that can take weeks, real-time AI control means faster convergence to a production-worthy process window with tighter within-wafer uniformity.

03

Production-relevant cycle times.

At ~2 seconds per cycle — approximately 10× faster than conventional ALE tools — atomic precision now comes at production-worthy throughput.

// Let's talk

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process challenge?

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// Get in touch

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